NEATEC offers a FREE workshop on Atomic Force Microscopy (AFM) with particular emphasis in techniques on how to prepare and use a desktop Atomic Force Microscope, how to create samples and how to interpret AFM images. The short course is designed for science and technology high-school teachers who plan to use the acquired knowledge in classroom activities.

By the end of the training you will be able to:

  • Understand the science behind the creation of images by an AFM
  • Know how to properly handle an AFM
  • Understand how to prepare samples
  • Understand how to load and take images of the sample
  • Know how to replace AFM probes
Registration Deadline:
November 30th, 2017
Type:
  • Workshop
ATE Area:
  • Micro and Nanotechnologies
Registration URL:
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Atomic Force Microscopy (AFM) Workshop.ics

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